文献类型：期刊文献

英文题名：A Linear Least Square with Duffing Chaotic Detection Designed in Micro-Distance Movement Measurement System

作者：Lin, Xiao[1];Dai, Yaping[1];Zhao, Linhui[2]

第一作者：Lin, Xiao

通讯作者：Lin, X[1]

机构：[1]Beijing Inst Technol, Sch Automat, 5 Zhongguancun South St, Beijing 100081, Peoples R China;[2]Beijing Union Univ, Sch Mechatron, Baijiazhuang Xili St, Beijing 100020, Peoples R China

第一机构：Beijing Inst Technol, Sch Automat, 5 Zhongguancun South St, Beijing 100081, Peoples R China

通讯机构：[1]corresponding author), Beijing Inst Technol, Sch Automat, 5 Zhongguancun South St, Beijing 100081, Peoples R China.

年份：2016

卷号：20

期号：2

起止页码：287-293

外文期刊名：JOURNAL OF ADVANCED COMPUTATIONAL INTELLIGENCE AND INTELLIGENT INFORMATICS

收录：EI(收录号：20161302173535);Scopus(收录号：2-s2.0-84961575113);WOS:【ESCI(收录号:WOS:000377526700013)】；

语种：英文

外文关键词：Duffing; chaos detection system; capacitance sensor; weak signal detection

摘要：High precision micro displacement measurement framework is fundamental for drilling strain gauges. We replaced the traditional lock-in amplifier method by the linear least square (LLS) based on Duffing chaotic detection (DCD) in drilling strain gauges. Simulation results showed that LLS based on DCD has a relative error 7.7% when SNR = -20.79 dB. It is 410.1% lower than lock-in amplifier method in the detection. Even more, the design and realization of LLS based on DCD is easier than lock-in amplifier method.