详细信息
Real-Time Defect Detection of Photovoltaic Cells Based on Lightweight YOLOv8 ( EI收录)
文献类型:期刊文献
英文题名:Real-Time Defect Detection of Photovoltaic Cells Based on Lightweight YOLOv8
作者:Yang, Ning[1]; Yan, Longde[1]; Chen, Aidong[2]
第一作者:Yang, Ning
机构:[1] Beijing Union University, Beijing Key Laboratory of Information Service Engineering, Beijing, China; [2] College of Robotics, Beijing Union University, Beijing, China
第一机构:北京联合大学北京市信息服务工程重点实验室
年份:2025
外文期刊名:Proceeding of 2025 IEEE 2nd International Conference on Deep Learning and Computer Vision, DLCV 2025
收录:EI(收录号:20253419030218)
语种:英文
外文关键词:Defects - Image processing - Industrial research - Nanotechnology - Photovoltaics - Solar energy - Solar power generation
摘要:Along with the rapid development of solar energy, photovoltaic (PV) cell defect detection has gradually become a global industrial issue and research hotspot of great concern. Ways to enhance detection precision, lower the rate of false positives and improve the system efficiency are the challenges ongoing in the domain of solar cell fault detection. As a result, an enhanced YOLOv8-based approach for detecting cell defects is presented. In order to increase the inference speed on CPU, a lightweight network PaddlePaddle-Lightweight CPU Net (PPLCNet) is used to serve as the core architecture. Alongside adopting the MPDIoU metric for spatial similarity assessment based on extremal point distances, the system introduces a reconstructed loss function that optimizes bounding box parameter regression through geometric regularization. Experiments show that this method achieves a 3.2 % increase in detection accuracy compared to YOLOv8, the detection time of a single image is only 0.6 ms, and the number of model parameters is 5. 9 M. This method shows excellent detection speed and low computing requirements in photovoltaic cell defect detection, and is especially suitable for the application scenarios of real-time monitoring and efficient processing, meeting the needs of fast response and efficient calculation. ? 2025 IEEE.
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