文献类型：会议论文

英文题名：Image-position Technology of the Digital Circuit Fault Diagnosis Based on Lab Windows/CVI

作者：Su Wei[1];Liu Ying[1];Dong Nanping[1]

第一作者：Su Wei

通讯作者：Su, W[1]

机构：[1]Beijing Union Univ, Coll Automat, Beijing 100101, Peoples R China

第一机构：北京联合大学城市轨道交通与物流学院

通讯机构：[1]corresponding author), Beijing Union Univ, Coll Automat, Beijing 100101, Peoples R China.|[1141751]北京联合大学城市轨道交通与物流学院;[11417]北京联合大学;

会议论文集：2nd International Symposium on Intelligent Information Technology Application

会议日期：DEC 21-22, 2008

会议地点：Shanghai, PEOPLES R CHINA

语种：英文

外文关键词：Failure analysis - Printed circuit boards - Probes - Program diagnostics - Timing circuits

摘要：This paper presents the different methods and processes of the implement of image-positioning technique, by which the user can locate the probe quickly and accurately during the process of circuit-fault-diagnosis. The article introduces the fault diagnosis program that can retrieves information from fault dictionary, presents the image-position technique of BMP and PCB and proposes the usage of the significant function and controls are given which can used to locate the probe accurately. During the test, the real circuit graph guides the user and points out the fault location, thus raising the efficiency of fault removal.