文献类型：会议论文

英文题名：A New Neural Network Approach to Electronic Circuit Fault Diagnosis

作者：Tian, WenJie[1];Geng, Yu[1]

通讯作者：Tian, W.

机构：[1]Beijing Union Univ, Automat Inst, Beijing, Peoples R China

第一机构：北京联合大学城市轨道交通与物流学院

通讯机构：[1]Automation Institute, Beijing Union University, Beijing, China|[1141751]北京联合大学城市轨道交通与物流学院;[11417]北京联合大学;

会议论文集：1st International Workshop on Education Technology and Computer Science

会议日期：MAR 07-08, 2009

会议地点：Wuhan, PEOPLES R CHINA

语种：英文

外文关键词：fault diagnosist; neural network; electronic circuit; classifier; integrated

摘要：To overcome the deficiencies of single neural network such as low diagnosis precision, long training time and bad generalized ability, an integrated neural network classifier is proposed for electronic circuit fault diagnosis in the paper. The investigation shows that the proposed method has higher classification precision and reliability, and is an ideal pattern classifier. Both simulation and experiment indicate that the proposed method is quite effective and ubiquitous.