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An DEA-based assessment for enterprise basic research on patented invention  ( EI收录)  

文献类型:会议论文

英文题名:An DEA-based assessment for enterprise basic research on patented invention

作者:Gui, Jie[1]; Lei, Xiaoping[1]; Sun, Mengyang[2]; Li, Peng[1]; Zhang, Zhaofeng[1]

第一作者:Gui, Jie

通讯作者:Gui, J.

机构:[1] Institute of Scientific and Technical Information of China, Beijing, China; [2] Tourism Institute, Beijing Union University, Beijing, China

第一机构:Institute of Scientific and Technical Information of China, Beijing, China

通讯机构:[1]Institute of Scientific and Technical Information of China, Beijing, China

会议论文集:2009 IEEE International Conference on Grey Systems and Intelligent Services, GSIS 2009

会议日期:November 10, 2009 - November 12, 2009

会议地点:Nanjing, China

语种:英文

外文关键词:Data envelopment analysis - System theory

摘要:Many researches show that basic research affects the development of technological innovation positively. But how to acquire and explore external knowledge resources of basic research is becoming an important and key question for those technological managers. The paper provides a research framework based on DEA to investigate the nature influence of enhanced utilization of basic research on patented inventions regarding the progress of technological innovation. We integrate internal and external basic research of the enterprises to measure the relationship between the absorptive ability of basic research and output of patented inventions. The result of an empirical study shows that basic research can improve the quantity and quality of patented inventions significantly only if the scale of basic research reaches the certain proportion. ?2009 IEEE.

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